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Performance Specification
KAF-1001E
KAF - 1001E 1024(H) x 1024(V) Pixel Enhanced Response Full-Frame CCD Image Sensor Performance Specification
Eastman Kodak Company Image Sensor Solutions Rochester, New York 14650
Revision 1 February 19, 2001
Eastman Kodak Company - Image Sensor Solutions - Rochester, NY 14650-2010 Phone (716) 722-4385 Fax (716) 477-4947 Web: www.kodak.com/go/ccd E-mail: ccd@kodak.com
Performance Specification
KAF-1001E
TABLE OF CONTENTS
1.1 Features ........................................................................................................................................... 3 1.2 Description ...................................................................................................................................... 3 1.3 Architecture..................................................................................................................................... 4 1.4 Image Acquisition ........................................................................................................................... 4 1.5 Charge Transport............................................................................................................................. 4 1.6 Output Structure .............................................................................................................................. 4 2.1 Package Configuration .................................................................................................................... 5 2.2 Pin Description................................................................................................................................ 6 3.1 Absolute Maximum Ratings ........................................................................................................... 8 3.2 DC Operating Conditions................................................................................................................ 8 3.3 AC Clock Level Conditions ............................................................................................................ 9 3.4 AC Timing..................................................................................................................................... 10 4.1 Image Specifications ..................................................................................................................... 12 4.2 Defect Classification ..................................................................................................................... 14 4.3 Typical Performance Data............................................................................................................. 15 5.1 Quality Assurance and Reliability................................................................................................. 17 5.2 Ordering Information .................................................................................................................... 17 6.1 Revision Changes.......................................................................................................................... 18
FIGURES Figure 1 Functional Block Diagram ...................................................................................................... 3 Figure 2 Package Configuration............................................................................................................ 5 Figure 3 Pinout Diagram ....................................................................................................................... 7 Figure 4 Timing Diagram.................................................................................................................... 12 Figure 5 Typical Spectral Response .................................................................................................... 15 Figure 6 Dark Current as a Function of Temperature ......................................................................... 16
Eastman Kodak Company - Image Sensor Solutions - Rochester, NY 14650-2010 Phone (716) 722-4385 Fax (716) 477-4947 Web: www.kodak.com/go/ccd E-mail: ccd@kodak.com 2 Revision No. 1
Performance Specification
KAF-1001E
Common applications include medical, scientific, military, machine and industrial vision. The sensor is built with a true two-phase CCD technology employing a transparent gate. This technology simplifies the support circuits that drive the sensor and reduces the dark current without compromising charge capacity. The transparent gate results in spectral response increased ten times at 400nm, compared to a front side illuminated standard polysilicon gate technology. The sensitivity is increased 50% over the rest of the visible wavelengths. The clock selectable on-chip output amplifiers have been specially designed to meet two different needs. The first is a high sensitivity 2-stage output with 11V/e- charge to voltage conversion ratio. The second is a single-stage output with 2V/e- charge to voltage conversion ratio.
1.1
*
Features
Front Illuminated Full-Frame Architecture with Blue Plus Transparent Gate True Two Phase Technology for high sensitivity 1024(H) x 1024(V) Photosensitive Pixels 24m(H) x 24m(V) Pixel Size 24.5 mm x 24.5 mm Photo active Area 1:1 Aspect Ratio 100% Fill Factor Single Readout Register 2 Clock Selectable Outputs High Gain Output (11 V/e-) for low noise Low Gain Output (2.0 V/e-) for high dynamic range Low Dark Current (<30 pA/cm2 @ T=25oC)
* * * * * * * * * *
1.2
Description
The KAF-1001E is a high-performance, silicon charge-coupled device (CCD) designed for a wide range of image sensing applications in the 0.4mm to 1.1mm wavelength band.
4 Dark Lines
KAF-1001E
Usable Active Image Area 1024(H) x 1024(V) 24m x 24m pixels H22 Sub Vdd 2 Vout 2 Vss
V1 V2 Guard
FD 1
FD 2
4 Dark Lines 1024 Active Pixels/Line H1 H2
Vdd 1 Vout 1 R Vrd Vog H21
4 Dark 4 Inactive
8 Dark 2 Inactive
Figure 1 - Functional Block Diagram
(Shaded areas represent 4 non-imaging pixels at the beginning and 8 non-imaging pixels at the end of each line. There are also 4 non-imaging lines at the top and bottom of each frame.)
Eastman Kodak Company - Image Sensor Solutions - Rochester, NY 14650-2010 Phone (716) 722-4385 Fax (716) 477-4947 Web: www.kodak.com/go/ccd E-mail: ccd@kodak.com 3 Revision No. 1
Performance Specification
KAF-1001E
V1 and V2 now reverse their polarity causing the charge packets to 'spill' forward under the V2 gate of the next pixel. The rising edge of V2 also transfers the first line of charge into the horizontal CCD. A second phase transition places the charge packets under the V1 electrode of the next pixel. The sequence completes when V1 is brought low. Clocking of the vertical register in this way is known as accumulation mode clocking. Next, the horizontal CCD reads out the first line of charge using traditional complementary clocking (using H1 and H2 pins) as shown. The falling edge of H2 forces a charge packet over the output gate (OG) onto one of the output nodes (floating diffusion) which controls the output amplifier. The cycle repeats until all lines are read.
1.3
Architecture
Refer to the block diagram in Figure 1. The KAF1001E consists of one vertical (parallel) CCD shift register, one horizontal (serial) CCD shift register and a selectable high or low gain output amplifier. Both registers incorporate true two-phase buried channel technology. The vertical register consists of 24m x 24m photo-capacitor sensing elements (pixels) which also serves as the transport mechanism. The pixels are arranged in a 1024(H) x 1024(V) array; an additional 12 columns (4 at the left and 8 at the right) and 8 rows (4 each at top and bottom) of non-imaging pixels are added as dark reference. Because there is no storage array, this device must be synchronized with strobe illumination or shuttered during readout.
1.4
Image Acquisition
An image is acquired when incident light, in the form of photons, falls on the array of pixels in the vertical CCD register and creates electron-hole pairs (or simply electrons) within the silicon substrate. This charge is collected locally by the formation of potential wells created at each pixel site by induced voltages on the vertical register clock lines (V1, V2). These same clock lines are used to implement the transport mechanism as well. The amount of charge collected at each pixel is linearly dependent on light level and exposure time and non-linearly dependent on wavelength until the potential well capacity is exceeded. At this point charge will 'bloom' into vertically adjacent pixels.
1.6
Output Structure
1.5
Charge Transport
Integrated charge is transported to the output in a two step process. Rows of charge are first shifted line by line into the horizontal CCD. 'Lines' of charge are then shifted to the output pixel by pixel. Referring to the timing diagram, integration of charge is performed with V1 and V2 held low. Transfer to horizontal CCD begins when V1 is brought high causing charge from the V1 and V2 gates to combine under the V1 gate.
The final gate of the horizontal register is split into two sections, H21 and H22. The split gate structure allows the user to select either of the two output amplifiers. To use the high dynamic range singlestage output (Vout1), tie H22 to a negative voltage to block charge transfer, and tie H21 to H2 to transfer charge. To use the high sensitivity two-stage output (Vout2), tie H21 to a negative voltage and H22 to H2. The charge packets are then dumped onto the appropriate floating diffusion output node whose potential varies linearly with the quantity of charge in each packet. The amount of potential change is determined by the simple expression Vfd=Q/Cfd. The translation from electrons to voltages is called the output sensitivity or charge-tovoltage conversion. After the output has been sensed off-chip, the reset clock (R) removes the charge from the floating diffusion via the reset drain (VRD). This, in turn, returns the floating diffusion potential to the reference level determined by the reset drain voltage.
Eastman Kodak Company - Image Sensor Solutions - Rochester, NY 14650-2010 Phone (716) 722-4385 Fax (716) 477-4947 Web: www.kodak.com/go/ccd E-mail: ccd@kodak.com 4 Revision No. 1
Performance Specification
KAF-1001E
2.1
Package Configuration
Figure 2 - Package Drawing
Eastman Kodak Company - Image Sensor Solutions - Rochester, NY 14650-2010 Phone (716) 722-4385 Fax (716) 477-4947 Web: www.kodak.com/go/ccd E-mail: ccd@kodak.com 5 Revision No. 1
Performance Specification
KAF-1001E
2.2
Pin Description
Symbol SUBSTRATE V2
V1 VOUT2
Pin Number 1, 4, 26 2, 21, 25 3, 22, 24 5 6 7 8 9 10 11 12 13 14 15 16 17 18, 19, 20 23
Description Substrate Vertical (Parallel) CCD Clock - Phase 2 Vertical (Parallel) CCD Clock - Phase 1 Video Output from High Sensitivity Two-Stage Amplifier High Sensitivity Two-Stage Amplifier Supply First Stage Load Transistor Gate for Two-Stage Amplifier Output Amplifier Return Reset Clock Reset Drain High Dynamic Range Single-Stage Amplifier Supply Video Output from High Dynamic Range Single-Stage Amplifier Output Gate Last Horizontal (Serial) CCD Phase - Split Gate Last Horizontal (Serial) CCD Phase - Split Gate Horizontal (Serial) CCD Clock - Phase 1 Horizontal (Serial) CCD Clock - Phase 2 No Connect Guard Ring
Notes 2 1
VDD2 VLG VSS
R VRD
VDD1 VOUT1 OG
H21 H22 H1 H2 N/C
GUARD
Notes: 1. Pins 3, 22, and 24 must be connected together - only one Phase 1 clock driver is required 2. Pins 2, 21, and 25 must be connected together - only one Phase 2 clock driver is required
Eastman Kodak Company - Image Sensor Solutions - Rochester, NY 14650-2010 Phone (716) 722-4385 Fax (716) 477-4947 Web: www.kodak.com/go/ccd E-mail: ccd@kodak.com 6 Revision No. 1
Performance Specification
KAF-1001E
26
Pixel (1024,1024)
SUB
1 2 3 4 5 6 7 8 9 10 11 12 13
Pixel (1,1)
SUB
V2 V1
SUB VOUT2 VDD2 VLG VSS R VRD VDD1 VOUT1 VO G
25 24 23 22 21 20 19 18 17 16 15 14
V2 V1
GUARD
V1 V2
N/C N/C N/C H2 H1 H22 H21
Figure 3 - Pin Identification Diagram
Eastman Kodak Company - Image Sensor Solutions - Rochester, NY 14650-2010 Phone (716) 722-4385 Fax (716) 477-4947 Web: www.kodak.com/go/ccd E-mail: ccd@kodak.com 7 Revision No. 1
Performance Specification
KAF-1001E
Min. -100 -50 -16 0 0 Max. +80 +50 +16 +8 +20 10 10 5 20 Units C Conditions At Device
3.1
Absolute Minimum/Maximum Ratings
Temperature Storage Operating All Clocks OG VRD, VSS, VDD, GUARD Output Bias Current (IDD) Output Load Capacitance (CLOAD) V1, V2 Pulse Width H1, H2 R Pulse Width
Voltage Current Capacitance Frequency/Time
V mA pF s MHz ns
VSUB = OV
8
Warning: For maximum performance, built-in gate protection has been added only to the OG pin. These devices require extreme care during handling to prevent electrostatic discharge (ESD) induced damage.
3.2
DC Operating Conditions
Substrate Output Amplifier Supply Output Amplifier Return Reset Drain Output Gate Guard Ring Load Gate Min. 0.0 15.0 1.4 11.5 3.0 7.0 0.5 Nom. 0.0 +17.0 +2.0 +12 +4.0 +10.0 +0.0 Max. 0.0 17.5 2.1 12.5 4.5 15.0 1.0 Units V V V V V V V Pin Impedance Common 5 pf, 2K? (Note 1) 5 pf, 2K? 5 pf, 1M? 5 pf, 10M? 350 pF, 10M?
VSUB VDD VSS VRD OG GUARD VLG
Notes: 1. Vdd = 17 volts for applications where the expected output voltage > 2.0 volts. For applications where the expected useable output voltsge is <2 volts, Vdd can be reduced to 15 volts.
Eastman Kodak Company - Image Sensor Solutions - Rochester, NY 14650-2010 Phone (716) 722-4385 Fax (716) 477-4947 Web: www.kodak.com/go/ccd E-mail: ccd@kodak.com 8 Revision No. 1
Performance Specification
KAF-1001E
3.3
V1 V2 H1 H2 R
AC Clock Level Conditions
Min. -10.25 0.0 -10.25 0.0 -2.2 7.8 -2.2 7.8 2.0 9.5 Nom. -10 0 -10.0 0 -2.0 +8.0 -2.0 +8.0 3.0 10.0 Max. -9.8 1.0 -9.8 1.0 -1.8 8.2 -1.8 8.2 3.5 11.0 Units V V V V V V V V V V Pin Impedance 200nF, 10M
Vertical Clock Phase 1 Vertical Clock Phase 2 Horizontal Clock Phase 1 Horizontal Clock Phase 2 Reset Clock
Low High Low High Low High Low High Low High
200nF, 10M CV1-V2 = 100nF 400pF, 10M
250pF, 10M Ch1-h2 =200pF 10pF, 10M
Using the High Gain Output (Vout2) Min. Nom. Max.
H21
Using the High Dynamic Range Output (Vout1) Min. Nom Max.
H2 H2
Units V V
Horizontal Clock - Phase 1
Low High
-4 -4
H22
Horizontal Clock - Phase 2
Low High
H2 low H2 low H2 H2
H2 low H2 low
Pin Impedance 10pF, 10M
-4 -4
H2 low H2 low
H2 low H2 low
V V
10pF, 10M
Notes: 1. When using Vout1 H21 is clocked identically with H2 while H22 is held at a static level. When using Vout2 H21 and H22 are exchanged so that H22 is identical to H2 and H21 is held at a static level. The static level should be the same voltage as H2 low. 2. The AC and DC operating levels are for room temperature operation. Operation at other temperatures may require adjustments of these voltages. Pins shown with impedances greater than 1 MOhm are expected resistances. These pins are only verified to 1 MOhm. 3. V1, 2 capacitances are accumulated gate oxide capacitance, and so are an over-estimate of the capacitance. 4. This device is suitable for a wide range of applications requiring a variety of different operating conditions. Consult Eastman Kodak in those situations in which operating conditions meet or exceed minimum or maximum levels.
Eastman Kodak Company - Image Sensor Solutions - Rochester, NY 14650-2010 Phone (716) 722-4385 Fax (716) 477-4947 Web: www.kodak.com/go/ccd E-mail: ccd@kodak.com 9 Revision No. 1
Performance Specification
KAF-1001E
3.4
AC Timing Chart
Symbol fH fV tpix tHS tV tR treadout tint tline Min. Nom. 4 100 250 1000 5 60 286 277 Max. 5 125 Units MHz kHz ns ns s ns ms
s
Description H1, H2 Clock Frequency V1, V2 Clock Frequency Pixel Period (1 Count) H1, H2 Setup Time V1, V2 Clock Pulse Width Reset Clock Pulse Width Readout Time Integration Time Line Time
Notes 1, 2, 3 1, 2, 3
200 500 4 20 226 219
2 4 5 6 7
Notes: 1. 50% duty cycle values. 2. CTE may degrade above the nominal frequency. 3. Rise and fall times (10/90% levels) should be limited to 5-10% of clock period. Crossover of register clocks should be between 4060% of amplitude. 4. R should be clocked continuously 5. treadout = (1032 * tline) 6. Integration time (tint) is user specified. Longer integration times will degrade noise performance due to dark signal fixed pattern and shot noise. 7. tline= (3 * tV) + tHS + 1044* tpix + tpix
Eastman Kodak Company - Image Sensor Solutions - Rochester, NY 14650-2010 Phone (716) 722-4385 Fax (716) 477-4947 Web: www.kodak.com/go/ccd E-mail: ccd@kodak.com 10 Revision No. 1
Performance Specification
KAF-1001E
AC Timing Diagram
Note: This device is suitable for a wide range of applications requiring a variety of different timing frequencies. Therefore, only maximum and minimum values are shown above. Consult Eastman Kodak in those situations that require special consideration
Frame Timing
tint
tReadout 1 Frame = 1032 lines
V1 V2 H1 H2 Line 1 2 1031 1032
Line Timing Detail tR R H1
Pixel Timing Detail
1 line V1 V2 tV tHS H1 H2 1044 counts R tpix
tV
tpix H2
1 count
Vout
Vsat
Vpix Vdark Vodc
Line Content 1-4 5-8 9-1032 1033-1042 1043-1044 Vsat Saturated pixel video output signal Photoactive Pixels Dark Reference Pixels Dummy Pixels
Vsub
Vdark Video output signal in no-light situation, not zero due to Jdark Vpix Pixel video output signal level; more electrons = more negative Vodc Video level offset with respect to vsub* Vsub Analog Ground * See Image Acquisition section
Figure 4 - Timing Diagram
Eastman Kodak Company - Image Sensor Solutions - Rochester, NY 14650-2010 Phone (716) 722-4385 Fax (716) 477-4947 Web: www.kodak.com/go/ccd E-mail: ccd@kodak.com 11 Revision No. 1
Performance Specification
KAF-1001E
4.1
Image Specifications
All values derived using nominal operating conditions with the recommended timing. Correlated doubling sampling of the output is assumed and recommended. Many units are expressed in electrons - to convert to voltage, multiply by the amplifier sensitivity.
Electro-Optical
Symbol FF PRNU QE Parameter Optical Fill Factor Photoresponse Non-uniformity Quantum Efficiency (450, 550, 650nm) Min. Nom. 100 Max. 5 Units % % rms Condition Full Array See QE curve
CCD Parameters Common To both Outputs
Symbol Ne-sat Jd DCDR DSNU CTE tVH Bs Parameter Sat. Signal - Vccd register Dark Current Dark Current Doubling Temp Dark Signal Non-uniformity Charge Transfer Efficiency V-H CCD Transfer Time Blooming Suppression Min. 450 Nom. 500 15.3 550 6 .99997 32 none Max. 30 1080 7 1080 Units ke pA/cm2 -pixel/sec e C e-/pix/sec
s
o
Condition Note 2 25C
(mean of all pixels)
5
Note 4 Note 5 Notes 6, 7
CCD Parameters Specific to High Gain Output Amplifier
Symbol Vout/NeNe-sat ne-total FH DR Parameter Output Sensitivity Sat. Signal Total Sensor Noise Horizontal CCD Frequency: Dynamic Range : Min. 9 180 Nom. 11 200 13 2 83 Max. 240 20 5 Units uV/electron kee- rms MHz dB Condition Note 1 Note 8 Note 6 Note 9
79
Eastman Kodak Company - Image Sensor Solutions - Rochester, NY 14650-2010 Phone (716) 722-4385 Fax (716) 477-4947 Web: www.kodak.com/go/ccd E-mail: ccd@kodak.com 12 Revision No. 1
Performance Specification
KAF-1001E
CCD Parameters Specific to Low Gain (high dynamic range) Output Amplifier
Symbol Vout/NeNe-sat ne-total FH DR Parameter Output Sensitivity Sat. Signal Total Sensor Noise Horizontal CCD Frequency: Dynamic Range : Min. 1.7 1400 Nom. 2 1500 22 0.5 87 Max. 1800 30 2 Units uV/electron kee- rms MHz dB Condition Note 3 Note 8 Note 6 Note 9
89
Notes: 1. Point where the output saturates when operated with nominal voltages. 2. Signal level at the onset of blooming in the vertical (parallel) CCD register 3. Maximum signal level at the output of the high dynamic range output. This signal level will only be achieved when binning pixels containing large signals. 4. None of 64 sub arrays (128 x 128) exceed the maximum dark current specification. 5. For 2MHz data rate and T = 30 C to -40C. 6. Using maximum CCD frequency and/or minimum CCD transfer times may compromise performance 7. Time between the rising edge of V1 and the first falling edge of H1 8. At Tintegration = 0; data rate = 1 MHz; temperature = -30 C 9. Uses 20LOG(Ne- sat / ne- total) where Ne- sat refers to the appropriate saturation signal.
Eastman Kodak Company - Image Sensor Solutions - Rochester, NY 14650-2010 Phone (716) 722-4385 Fax (716) 477-4947 Web: www.kodak.com/go/ccd E-mail: ccd@kodak.com 13 Revision No. 1
Performance Specification
KAF-1001E
4.2 Cosmetic Grades Standard:
Class C1 C2 C3 Point Defects 20 40 80 Cluster Defects 2 10 20 Column Defects 0 0 10
UV Enhanced:
U2 40 10 0 Note 1
Notes: 1. Sensors with an UV enhancement coating are available with the same cosmetic grade as the uncoated C2.
Dark Defect Bright Defect Cluster Defect Column Defect
A pixel which deviates by more than 20% from neighboring pixels when illuminated to 70% of saturation A pixel whose dark current exceeds 4500 electrons/pixel/second at 25C A grouping of not more than 5 adjacent point defects. 1) 2) 3) 4) A grouping point defects along a single column. (Dark Column) A column that contains a pixel whose dark current exceeds 150,000 electrons/pixel/second at 25 C. (Bright Column) A column that does not exhibit the minimum charge capacity specification. (Low charge capacity) A column that loses >500 electrons when the array is illuminated to a signal level of 2000 electrons/pix. (Trap like defects)
Neighboring Pixels
The surrounding 128 x 128 pixels of 64 columns/rows
Defects are separated by no less than 3 pixels in any one direction. 1,1024 1024,1024
All pixels subject to defect specification
1,1
1024,1
Eastman Kodak Company - Image Sensor Solutions - Rochester, NY 14650-2010 Phone (716) 722-4385 Fax (716) 477-4947 Web: www.kodak.com/go/ccd E-mail: ccd@kodak.com 14 Revision No. 1
Performance Specification
KAF-1001E
4.3 Typical Performance Data
Kodak Full Frame Image Sensor Spectral Response
1 0.9
Absolute Quantum Efficiency
0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 300
400
500
600
700
800
900
1000
1100
Wavelength (nm)
KAF-1001E : 24 um pixel KAF-1401E: 6.8 um pixel
Figure 5 - Typical Spectral Response
Figure 5 shows a representative spectral response of front side illuminated transparent gate full frame image sensors. The KAF-1001E with 24m pixels has higher response than the 6.8m pixel sensor at wavelengths greater than 750nm because it is constructed on a lower resistivity silicon substrate. The resulting collection volume of each pixel more efficiently collects signal generated deeper within the silicon. Most of the two phase CCD pixels are designed so that each of the electrodes occupies half of the pixel area. The KAF1001E was not designed this way but instead is designed with the transparent electrode occupying greater than half the pixel area. This further improves the benefits of the transparent gate.
Eastman Kodak Company - Image Sensor Solutions - Rochester, NY 14650-2010 Phone (716) 722-4385 Fax (716) 477-4947 Web: www.kodak.com/go/ccd E-mail: ccd@kodak.com 15 Revision No. 1
Performance Specification
KAF-1001E
KAF-1001E Dark Current
1000
Electrons/pixel/sec
100
10
1 -20 -10 0 10 20 30 Temperature (C)
Figure 6 - Dark Current as a Function of Temperature
Eastman Kodak Company - Image Sensor Solutions - Rochester, NY 14650-2010 Phone (716) 722-4385 Fax (716) 477-4947 Web: www.kodak.com/go/ccd E-mail: ccd@kodak.com 16 Revision No. 1
Performance Specification
KAF-1001E
5.1
Quality Assurance and Reliability
5.1.1 Quality Strategy: All devices will conform to the specifications stated in this document. This is accomplished through a combination of statistical process control and inspection at key points of the production process. 5.1.2 Replacement: All devices are warranted against failure in accordance with the terms of Terms of Sale. 5.1.3 Cleanliness: Devices are shipped free of contamination, scratches, etc. that would cause a visible defect. 5.1.4 ESD Precautions: Devices are shipped in a static-safe container and should only be handled at static-safe workstations. 5.1.5 Reliability: Information concerning the quality assurance and reliability testing procedures and results are available from the Image Sensor Solutions and can be supplied upon request. 5.1.6 Test Data Retention: Devices have an identifying number of traceable to a test data file. Test data is kept for a period of 2 years after date of shipment.
5.2
Ordering Information
Address all inquiries and purchase orders to: Image Sensor Solutions Eastman Kodak Company Rochester, New York 14650-2010 Phone: (716) 722-4385 Fax: (716) 477-4947 E-mail: ccd@kodak.com
Kodak reserves the right to change any information contained herein without notice. All information furnished by Kodak is believed to be accurate.
Eastman Kodak Company - Image Sensor Solutions - Rochester, NY 14650-2010 Phone (716) 722-4385 Fax (716) 477-4947 Web: www.kodak.com/go/ccd E-mail: ccd@kodak.com 17 Revision No. 1
Performance Specification
KAF-1001E
6.1
Revision Changes:
Revision Number 0 1 Description of Changes Initial formal version. Section 4.1, CCD Parameters Common to both Outputs: Ne-sat (Sat. Signal - Vccd Register: Minimum changed from 550 to 450ke Nominal changed from 650 to 500ke. Update for name change from Microelectronics Technology Division to Image Sensor Solutions. Eliminated Appendix 1 - Available Part Numbers Added Section 6.1: Revision Changes. Changes are in red.
Eastman Kodak Company - Image Sensor Solutions - Rochester, NY 14650-2010 Phone (716) 722-4385 Fax (716) 477-4947 Web: www.kodak.com/go/ccd E-mail: ccd@kodak.com 18 Revision No. 1

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